Intelligent Testing Lab @ University of Sheffield

We are based at the School of Computer Science, University of Sheffield, part of the AI x Software Engineering & Testing (ASET) research group.

Selected publications

DT-Drive: A Tool for Deterministic Replay-Based Testing and Debugging of Autonomous Driving Systems

Sanjeetha Pennada, Matthew Leach, Olek Osikowicz, and 1 more author

In International Conference on Automated Software Engineering (ASE) 2026, Oct 2026

Bib PDF Code

@inproceedings{pennada2026dtdrive,
  title = {DT-Drive: A Tool for Deterministic Replay-Based Testing and
                   Debugging of Autonomous Driving Systems},
  author = {Pennada, Sanjeetha and Leach, Matthew and Osikowicz, Olek and Shin, Donghwan},
  booktitle = {International Conference on Automated Software Engineering (ASE) 2026},
  month = oct,
  year = {2026},
}

Multi-Fidelity Bayesian Optimization for Simulation Based Autonomous Driving Systems Testing

Olek Osikowicz, Phil McMinn, Wei Xing, and 1 more author

In 2026 IEEE Intelligent Vehicles Symposium (IV), Jun 2026

Bib PDF Poster

@inproceedings{osikowicz2026multi,
  title = {Multi-Fidelity Bayesian Optimization for Simulation Based Autonomous Driving Systems Testing},
  author = {Osikowicz, Olek and McMinn, Phil and Xing, Wei and Shin, Donghwan},
  booktitle = {2026 IEEE Intelligent Vehicles Symposium (IV)},
  year = {2026},
  month = jun,
  organization = {IEEE},
}

CAWSR: Carla-AutoWare Scenario Runner

David Gasinski, Olek Osikowicz, Gwilym Rutherford, and 1 more author

Jan 2026

Under review at Journal of Open Source Software (JOSS)

PDF Code

Empirically Evaluating Flaky Tests for Autonomous Driving Systems in Simulated Environments

Olek Osikowicz, Phil McMinn, and Donghwan Shin

In 2025 IEEE/ACM International Flaky Tests Workshop (FTW), 2025

DOI Bib PDF

@inproceedings{osikowicz2025empirically,
  title = {Empirically Evaluating Flaky Tests for Autonomous Driving Systems in Simulated Environments},
  author = {Osikowicz, Olek and McMinn, Phil and Shin, Donghwan},
  booktitle = {2025 IEEE/ACM International Flaky Tests Workshop (FTW)},
  year = {2025},
  pages = {13--20},
  organization = {IEEE},
  citekey = {osikowicz2025empirically},
  doi = {10.1109/FTW66604.2025.00009},
}